ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An instrument with the tip positioning capability of a scanning tunneling microscope and the imaging capability of a field emission electron microscope has been developed. This instrument provides the ability to investigate the current-voltage characteristics of field emitter tips in the metal-vacuum, transition, and metal-vacuum-metal tunneling regimes. It also allows a field emitter tip to be imaged before and after these "close approach" measurements are made. Nonreproducible tunneling characteristics observed in the transition region have been associated with large changes in the apex of the field emitter tip. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148900
