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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 412-417 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel type of polarized 3He ion source based on "electron pumping" was recently proposed. This ion source requires multiple electron capture and stripping collisions of 3He+ ions with polarized alkali atoms under a strong magnetic field (2–3 T). Since these processes may induce a serious increase in the emittance and reduction of polarized beam intensity, we investigated them in detail by using the Monte Carlo simulation. It was found that there is (1) increase in the emittance results not from angular broadening but from a beam size enlargement, (2) the phenomena under magnetic field B are simplified by a collisionless phenomenon under a weaker magnetic field (effective magnetic field) Beff defined by Beff(similar, equals)(λ+0/(λ+0+λ0+))B, where λ+0 and λ0+ are mean free paths for 3He+ ions and 3He0 atoms traveling in the alkali vapor. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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