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Technique to monitor the local temperature rise during laser irradiation of transparent dielectrics (1998)

Asbury, G. ; Bunton, P.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 69 (1998), S. 603-604

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A CO2 laser and xenon lamp were used to monitor the temperature rise in lithium niobate, a transparent dielectric. The CO2 laser was used to heat the sample while the xenon lamp was used to monitor the energy absorption at the band gap where the absorption is exponentially dependent upon the temperature. This technique provides a means of determining temperature rise at the laser spot with both spatial and temporal resolution. In addition, it should be applicable to many transparent dielectrics. © 1998 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1148461

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