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Medium and high energy x-ray instrument for sample characterization (1996)

Petrillo, C. ; Rocchi, C. ; Sacchetti, F.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 67 (1996), S. 693-696

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A medium to high energy x-ray diffractometer, based on commercial components, is described. The performances of such an instrument in investigating relatively thick crystalline samples are exploited. Results of test measurements, among which is the characterization of a single crystal of Ge as thick as 1 cm, are reported. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1146842

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