ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Photon stimulated ion desorption from small molecules on Si(100) surfaces and from polymer thin films was studied using time-of-flight (TOF) mass spectrometric techniques. The design and operation of a TOF mass spectrometer during single bunch operation of the Photon Factory 2.5 GeV storage ring is described. Experimental results for H2O/Si(100), DCOOD/Si(100), polymethylmethacrylate and polymethylacrylate thin films are demonstrated as examples of the capabilities of the apparatus. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145945