Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
65 (1994), S. 845-849
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A laboratory spectrometer designed for routine extended x-ray absorption fine structure (EXAFS) measurements in dispersive mode is described. Factors determining energy range and resolution are detailed. An empirical energy calibration procedure is proposed. EXAFS spectra obtained for copper and zirconium metal foil and molecular complex ZrOCl2 compare favorably with data obtained using a conventional synchrotron facility.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144909
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