ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Transport current-voltage (I-V) characteristics gathered over several orders of magnitude of current can reveal much about the loss mechanisms in high Tc superconductors. This article describes the design and implementation of a novel, computer-controlled, I-V characterization system which permits a I-V curve spanning five orders of magnitude of current to be captured in 50 ms. The advantages of this system over other methods of obtaining I-V curves are discussed. The system is applied to the study of high Tc superconductors and preliminary measurements are presented. Data obtained at 77 K for polycrystalline YBa2Cu3O7−δ are shown to be consistent with a I-V relation of the form, V=k(I−Ic)n, where Ic is the critical current, and k and n are constants.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143163
