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Source of low-energy hydrogen ions for measuring electron transfer in surface scattering experiments (1992)

Isenberg, J. D. ; Kwon, H. J. ; Seidl, M.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 5289-5293

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: We present the design and performance of a beamline which is the source of 5–50-eV protons for surface scattering experiments. The beamline also incorporates a collector for measuring total secondary ion and electron yields. The beam forming optics are built around a commercially available gas discharge ion gun and produce a mass-selected, energy-filtered beam. Results of computer ray tracing are included to illustrate the operation of the beam optics. Tests have produced 50-pA proton beams 3.5-mm wide at 5 eV with an energy spread of about 1 eV.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1143441

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