ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new scheme to extend the triple Langmuir probe technique for the measurement of electron temperature fluctuations and the fluctuation-driven transport has been developed. The extension is aimed at reducing the phase delay error introduced by finite probe tip separations in standard triple-probe method. The modified triple-probe scheme provides a more reliable measurement of the temperature fluctuations for a proper interpretation of the density and potential fluctuations and the transport measurement from Langmuir probe data. New results on fluctuations have been obtained from Phaedrus-T and TEXT-U tokamaks.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143683