ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
X-ray absorption fine structure (XAFS) measurements in regions less than 20 μm in diameter were realized using an x-ray microprobe employing the fluorescence detection method. To realize an energy tunable intense small x-ray beam, an ellipsoidal mirror was used as the synchrotron radiation focusing element combined with a double-crystal monochromator. Distortion of a XAFS spectrum due to the self-absorption effect is discussed in detail. The degree of the distortion was experimentally evaluated from the measurement of the x-ray fluorescence intensity as a function of takeoff angle, and the distortion was significantly reduced with the small takeoff angle detection geometry. Utilizing this technique, reliable XAFS spectra were obtained from a rock sample containing several minerals.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142228
