ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Soft x-ray pinhole imaging has recently become established as a valuable diagnostic for visualization of field reversed configuration (FRC) plasmas in the TRX-2, FRX-C/LSM devices. Gated MCP image converter devices with CsI cathodes and Be filters with a peak response around 11 nm wavelength are used for exposure durations ranging from a few tenths up to several microseconds. Results of experiments with single and Chevron channel plates are discussed along with estimates of linear exposure limitations with both film and CCD cameras as recording media. Plans for multiframe devices on the FRX-C/LSM and the LSX devices are also discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141834
