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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2373-2375 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Synchrotron radiation obtained from the 6-T vertical-wiggler source at the Photon Factory has been used to study dynamical x-ray diffraction in a nearly perfect germanium crystal under total external reflection conditions. A specially designed goniometer has allowed independent control of the glancing angle and the deviation angle from exact Bragg incidence. The rocking-curve profiles observed from slightly asymmetric Bragg planes as a function of glancing angle were found to be quite different for both the diffracted and specular beams. These profiles show unusual features arising from the excitation or de-excitation of the wave fields in shallow surface layers of the bulk crystal. Furthermore, GeK fluorescence signals measured during the Bragg reflection showed characteristic modulations, demonstrating the feasibility of new standing-wave experiments for determination of interface structures.
    Type of Medium: Electronic Resource
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