Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
59 (1988), S. 1294-1302
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The design and performance of a low-energy ion gun system suitable for surface analysis is described. The ion gun system is capable of delivering up to a 0.72 μA beam of Ar+ ions at a potential of 500 eV into a spot diameter of 1 mm. This performance is accomplished by using ion optics to refocus the space-charge diverging beam along the 44-cm path to the target. The ion optics have been optimized by the use of a new simulation program, chden, which can model a series of lenses and the effects of space-charge forces.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139712
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