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Digitale Medien

Gas phase study of silicon–C60 complexes: Surface coating and polymerization (2000)

Pellarin, M. ; Ray, C. ; Lermé, J. ; [weitere]

College Park, Md. : American Institute of Physics (AIP)

The Journal of Chemical Physics 112 (2000), S. 8436-8445

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Details

ISSN: 1089-7690

Quelle: AIP Digital Archive

Thema: Physik , Chemie und Pharmazie

Notizen: (C60)nSim+ cationic clusters are produced in a laser vaporization source by quenching the vapors from two independent C60 and silicon targets. They are analyzed in the gas phase by abundance and photofragmentation time-of-flight mass spectroscopy. For complexes containing only one C60 molecule, silicon is unlikely to wet the fullerene surface. Mass spectroscopic studies are rather in favor of a three-dimensional growth of silicon clusters weakly bound to C60. For larger systems, one can distinguish two classes of silicon atoms: most of them group in the form of compact islands (or clusters) and some others are directly involved in the linkage of C60 molecules. Particular geometric structures for the stable polymers (C60Si)n−2(C60)2+, (C60Si)n−1C60+, and (C60Si)n+ are postulated. © 2000 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.481447

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