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Digitale Medien

Hard x-ray interaction with materials : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)

Tong, X. M. ; Watanabe, T. ; Yamaoka, H. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 493-495

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Details

ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Based on the analyses of microprocesses involved in the interaction of synchrotron radiation with materials, we have developed a simulation method to calculate heat energy distribution when the synchrotron radiation goes through insert devices (filters, mirrors, or monochromators). The absorbed x-ray energy may be taken away from materials when some scattered photon and photoelectron escape from material. We have calculated the percentage of the absorbed energy taken away by the escaped photons and photoelectrons for C, Be, and Al, these elements being very important as filter materials, and for Si which is significant as a monochromator material.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1143803

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