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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 15 (1986), S. 107-109 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Measurements of the target-thickness dependence of the target K x-ray production yields are reported for 1 and 2 MeV/amu Sq+ (q = 6 and 8) ions incident upon thin solid targets of Ge. Target K x-ray production cross-sections were extracted in the limit of vanishing target thickness. Comparisons of the data with theoretical estimates based on combinations of direct ionization and electron-transfer processes are presented.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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