ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
Pendellösung intensity beats of white radiation diffracted from parallel-sided single-crystal wafers of silicon were measured by a solid-state detector. After a few corrections, the extremum positions in the beat were measured to evaluate the atomic scattering factors for various reflections. The scattering factor shows a dependence on wavelength, λ, which can be interpreted by the anomalous dispersion term, f', as calculated by Cromer [Acta Cryst. (1965), 18, 17-23]. The obtained values of the atomic scattering factor expressed as linear functions of wavelength are listed with those at λ = 0.5594 Å for comparison with the data so far obtained with Ag Kα1 and wedge crystals. The values for 111 and 220 reflections in the present experiment, 10.59 and 8.40, were almost the same as Tanemura & Kato's [Acta Cryst. (1972), A28, 69-80], 10.664 and 8.463, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739480002070
