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  • 1
    Electronic Resource
    Electronic Resource
    Dielectric characterization of polycrystalline Sr2Bi4Ti5O18 (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 3885-3889 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Five layered Sr2Bi4Ti5O18 has been prepared in the ceramic form with a view to studying its electrical properties. X-ray and microstructural studies were employed for physical characterization. Detailed electrical property measurements were undertaken so as to understand the basic transport physics of this compound. The results of dielectric studies, dc conductivity, and ac impedance are discussed, and a defect formula for Sr2Bi4Ti5O18 has been proposed. The investigations on this material at high temperatures and frequencies reveal its stable behavior. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371304
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