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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5511-5518 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Extreme ultraviolet (XUV) spectral line emissivities, originating from resonant transitions with upper states excited mainly from ground or both ground and lowest metastable states by electron collisional excitations of highly ionized intrinsic impurities in tokamak plasmas, are linear functions of both electron density and temperature fluctuations, ñe and T˜e, when the fluctuations are small and at high frequency. Correlations between measured intensities of spectral lines can thus provide localized measurements of the fluctuations. Newly developed XUV monochromators of high throughput enable accurate and fast diagnostics of ñe and T˜e for the study of the tokamak plasma microturbulence.
    Type of Medium: Electronic Resource
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