Electronic Resource
College Park, Md.
:
American Institute of Physics (AIP)
The Journal of Chemical Physics
96 (1992), S. 8171-8176
ISSN:
1089-7690
Source:
AIP Digital Archive
Topics:
Physics
,
Chemistry and Pharmacology
Notes:
Coincidence counting methods were used to examine the desorption of secondary ions from a CsI surface via keV atomic and polyatomic projectile impacts. A correlation between the emission of I− and CsI−2 secondary ions was attributed to the common chemical origin of the ions. The degree to which I− and CsI−2 were correlated was observed to change as a function of the kinetic energy and complexity of the primary ion as well as the yield of I−. This is attributed to a change in the relative importance of competing ion formation processes as a function of the energy in the desorption site.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.462321
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