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Preparation of silver tips for scanning tunneling microscopy imaging (1998)

Iwami, M. ; Uehara, Y. ; Ushioda, S.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 69 (1998), S. 4010-4011

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A simple reliable preparation method of silver tips for scanning tunneling microscopy imaging with atomic resolution is presented. The procedure is based on two-step electrochemical processing; ac electropolishing and subsequent dc electroetching. The quality of the tip is improved by applying high bias voltage pulses while the tip is within tunneling range. This indicates that the end of the tips are sharpened by field evaporation of silver ions. © 1998 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1149215

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