ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have calibrated the displacement/voltage (A(ring)/V) response of our piezoelectric scanning tube (PZT-5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (A(ring)/V) response as a function of voltage up to 220 V at room temperature, imaging a gold-plated diffraction grating. We find that the temperature dependence of the (A(ring)/V) response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the (A(ring)/V) response makes the PZT-5A lead zirconate titanate composition a convenient choice for low temperature scanning tunneling microscope piezo tube elements.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144139