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  • Articles: DFG German National Licenses  (4)
  • 1990-1994  (4)
  • 1992  (4)
  • Polymer and Materials Science  (4)
Source
  • Articles: DFG German National Licenses  (4)
Material
Years
  • 1990-1994  (4)
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Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Probing depth of soft x-ray absorption spectroscopy measured in total-electron-yield mode (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 65-69 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Two series of experiments on well-characterized systems were performed to examine the probing depth of soft x-ray absorption spectroscopy (XAS) measured in total-electron-yield (TEY) mode. First we measured the Ni 2p3/2 absorption spectra of Ni(100) covered with Tb as a function of the overlayer thickness. Secondly we recorded the O 1s absorption spectra of Ta2O5 films produced by controlled anodic oxidatio of Ta foils as a function of the oxide thickness. The mean probing depth (MPD) was found to be much shorter than previously assumed (for O 1s, only 1.9 nm). The relative importance of those cascade mechanisms that lead to the electron current measured in TEY is discussed.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740180111
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Grain boundary segregation in [100] symmetrical tilt bicrystals of an Fe—Si alloy (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 601-606 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The orientation and temperature dependences of the segregation of P, Si and C at [100] symmetrical tilt grain boundaries of an Fe-3.5 at.% Si alloy were determined by AES analysis of in situ fractured bicrystals. The obtained anisotropy of the segregation enthalpy of all three elements is characterized by its low absolute values for the {013} and {012} boundaries. Both of these boundaries belong to the low classification levels after Paidar and possess high values of interplanar spacing which can be used as a simple geometric criterion of the boundary ‘specialty’. The data are consistent with the construction of the grain boundary segregation diagram showing the dependence of the segregation enthalpy on both the boundary orientation and the maximum solid solubility of the solute.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.7401901112
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Quantitative studies of the initial oxidation stages of FeCrNi alloys using factor analysis and least-squares fitting methods applied to low-energy AES spectra (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 157-160 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The oxidation behaviour of the alloys Fe-19 at.% Cr-9 at.% Ni and Ni-40 at.% Fe-20 at.% Cr was studied in situ at room temperature and oxygen pressures below 10-4 Pa by AES using low-energy M23VV transitions between 20 and 70 eV. Quantitative determination ofthe relevant components by factor analysis and least-squares fitting methods enabled a much more detailed analysis of the initial oxidation stages as compared to earlier studies. For all alloy elements, factor analysis revealed the presence of an intermediate chemical state before oxidation which is due to binding with chemisorbed oxygen. Least-squares fitting with standrd spectra of the pure elements in their metallic, oxidic and intermediate states disclosed the sequential oxidation of Cr, Fe and Ni with increasing oxygen exposure. Preferential oxygen chemisorption on Cr and oxidation of Cr is accompanied by oxygen-induced segregation and is followed by Fe and Ni oxidation on top of the previously formed oxide for the Ni-rich alloy. Nickel oxidation is drastically reduced in Fe-rich alloys. After exposure to 900 L of oxygen, oxidation results in a layered structure as confirmed by AES sputter depth profiles which can be resolved into oxide and pure metal components. Together with the small electron escape depth of only 2-4 atomic layers, this procedure gives well-resolved depth distributions within the total oxide thickness of ∼6-7 monolayers for NiFe40Cr20 and 11-12 monolayers for FeCr19Ni9.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190130
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Alternative model multilayer structures for depth profiling studies (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 50-54 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: There exists a permanent need for new model systems appropriate for the study of depth profiling with different surface analysis techniques, e.g. AES, XPS and SIMS, which involves the ion sputtering process. The development, preparation, transmission electron microscopy (TEM) characterization and AES depth profiling behaviour of the following new multilayer structures are presented: metal/oxide and oxide/oxide multilayers composed of Ni, Cr, NiO and Cr2O3 thin films and metal/semiconductor multilayers composed of Ni, Cr and Si thin films. These multilayer structures were sputter deposited on smooth silicon substrates and were precisely characterized with AES depth profiling during sample rotation and (two of them) with TEM. The measured compositional depth profiles are explained with respect to the influence of cystalline and amorphous structures on depth resolution, and the advantages of each type of multilayer structure are discussed.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190112
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    Paper (German National Licenses)
    Fulltext
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