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Digitale Medien

Determination of nonlinear absorption and refraction by single Z-scan method (2000)

Yin, M. ; Li, H.P. ; Tang, S.H. ; [weitere]

Springer

Applied physics 70 (2000), S. 587-591

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Details

ISSN: 1432-0649

Schlagwort(e): PACS: 42.65.An; 78.20.Ci; 78.40.Fy

Quelle: Springer Online Journal Archives 1860-2000

Thema: Physik

Notizen: Abstract. We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/s003400050866

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