ISSN:
1572-9605
Keywords:
Erbium-barium-copper-oxide
;
sputtering
;
buffered substrates
;
multisource sputtering
;
silicon substrates
;
SNMS
;
depth profiling
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract High-quality superconducting films of erbium-barium-copper-oxide have been produced in a multisource sputtering system on a variety of substrates, including buffered sapphire and silicon wafers as well as various single-crystal materials. Fine-grained polycrystalline films with narrow (〈4 K) resistive transitions have been grown on a number of different substrates. The use of erbium in the 12–3 compound leads to improved film morphology and to more forgiving conditions for establishing of the superconducting phase. Sputtered neutral mass spectroscopy (SNMS) yields useful information about the compositional profile of the films.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00617720
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