ISSN:
1432-2242
Keywords:
Leaf blight
;
Joint scaling test
;
Generation mean analysis
;
Epistasis
;
Additive gene action
Source:
Springer Online Journal Archives 1860-2000
Topics:
Biology
Notes:
Summary Studies on the genetics of leaf blight caused byAlternaria triticina using generation mean analysis revealed that additive components played a major role, but that dominance components also contributed significantly in controlling the variability for leaf blight resistance in wheat crosses. Furthermore, the additive x additive type of epistasis was predominant in the first three crosses, whereas in the fourth cross additive x dominance (j) and dominance x dominance (1) components of epistasis were most significant. Because of this it may be desirable to follow a simple recurrent selection scheme for higher tolerance, to isolate resistant plants from the segregating populations derived from crosses of parents of diverse origin following the pedigree method of breeding. CPAN-1887 was very tolerant to leaf blight in the present study and should be utilized in hybridization programs to develop leaf-blight-resistant varieties.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00588589
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