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  • Articles: DFG German National Licenses  (13)
Source
  • Articles: DFG German National Licenses  (13)
Material
Years
  • 11
    Electronic Resource
    Electronic Resource
    Tailoring the microwave dielectric properties of BaRE2Ti4O12 and BaRE2Ti5O14 ceramics by compositional variations (2000)
    Springer
    Journal of materials science 11 (2000), S. 595-602 
    Details
    ISSN: 1573-482X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Ceramic dielectric resonators in the BaO-RE2O3-TiO2 (RE=rare earth) system have been prepared by the conventional solid state ceramic route. The dielectric properties have been tailored by substitution of different rare earth oxides and by bismuth oxide addition. The dielectric constants increased with Bi addition whereas the Q decreased. The temperature coefficient of the resonant frequency improved with bismuth addition.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008924611465
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    Paper (German National Licenses)
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  • 12
    Electronic Resource
    Electronic Resource
    New low loss microwave dielectric ceramics in the BaO-TiO2-Nb2O5Ta2O5 system (1999)
    Springer
    Journal of materials science 10 (1999), S. 475-478 
    Details
    ISSN: 1573-482X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Microwave ceramic dielectric resonator materials in the BaO-TiO2-Nb2O5Ta2O5 system such as BaTiNb4O13, BaTiTa2Nb2O13, BaTiTa4O13, Ba3Ti4Nb4O21, Ba3Ti4Ta4O21, Ba3Ti5Nb6O28, Ba3Ti5Ta6O28 and Ba3Ti5Nb3Ta3O28 have been prepared by the conventional solid state ceramic route. They have relatively high dielectric constant and high quality factor. The resonator materials are characterized by X-ray diffraction and scanning electron microscopy (SEM) methods. The BaTiNb4O13Ba3Ti5Nb6O28 and Ba3Ti5Nb3Ta3O28 have small temperature variation of the resonant frequency and are possible microwave dielectric resonator materials for practical applications.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008915715602
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    Paper (German National Licenses)
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  • 13
    Electronic Resource
    Electronic Resource
    X-ray diffraction from faulted zinc sulphide crystals undergoing phase transitions (1988)
    Springer
    Journal of materials science 23 (1988), S. 2014-2020 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Stacking faults in close-packed structures are not always distributed randomly. When they occur preferentially at certain layer spacings. In such cases the classical theories of X-ray scattering from randomly faulted close-packed structures break down and a probability distribution of faults has to be assumed to compute the diffraction effects. This probability distribution faults has to be assumed to compute the diffraction effects. This probability distribution depends on the mechanism of the transformation in the material being studied. By recording the diffuse intensity distribution along reciprocal lattice rows perpendicular to the faults obtained from a partially transformed crystal it is possible to determine the nature of the faults involved and derive information about the mechanism of the transformation. The application of this method to investigate the mechanism of 2H → 3C and 2H → 6H transformations in ZnS, Zn x ,Cd1-x S and Zn x ,Mn1-x S is discussed. A three parameter model assuming different fault probabilities for deformation faulting at larger separations (a), at three-layer separations (β) and at two-layer separations (γ) has been developed, to compute theoretically the diffraction effects from the transforming crystals and explain the experimentally observed distribution of diffuse intensity in reciprocal space.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01115763
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    Paper (German National Licenses)
    Fulltext
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