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  • 1985-1989  (2)
  • 1989  (1)
  • 1985  (1)
Material
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  • 1985-1989  (2)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2530-2531 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A laser interferometric method is described by which the length-to-voltage sensitivity of piezoelectric elements, as used e.g., in scanning tunneling microscopes, can be calibrated. The method is based on measuring the optical frequency of a laser locked to a piezoelectrically tuned interferometer, relative to a stable reference. The high sensitivity of this technique allows the calibration to be carried out in the low-voltage regime.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 58 (1985), S. 1841-1850 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Aluminum was ion implanted with deuterium (D) and then subjected to linear temperature ramping, and the resulting D redistributions were monitored using the ion-induced nuclear reaction D(3He, p)4He. Data from such experiments were analyzed in terms of various immobilization processes, utilizing numerical solutions of the appropriate diffusion formalism. The identification of mechanisms was augmented by transmission electron microscopy. Irradiation defects believed to be of vacancy type were shown to trap the D with a binding enthalpy of 0.52±0.10 eV relative to solution sites, in excellent agreement with calculations based on effective medium theory. Stronger binding at the surface oxide was quantitatively described by assuming the formation of D2 molecules at the metal-oxide interface. At higher implanted concentrations the immobilization of D by precipitation of D2 bubbles was observed, and the subsequent release from these bubbles at more elevated temperatures was described by diffusion theory. Small, high-pressure He bubbles formed by ion implantation of He did not trap the D more strongly than the irradiation defects, in contrast to observations in a number of other metals, but consistent with predictions of effective medium theory for Al.
    Type of Medium: Electronic Resource
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