Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1985-1989  (2)
  • 1987  (2)
  • 23.60.+ e  (1)
  • Polymer and Materials Science  (1)
Source
Material
Years
  • 1985-1989  (2)
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Observation of the isotopes264108 and265108 (1987)
    Springer
    The European physical journal 328 (1987), S. 49-59 
    Details
    ISSN: 1434-601X
    Keywords: 23.60.+ e ; 25.70.Jj ; 27.9.+b
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The experiment having led to the discovery of first isotopes of element 108, as published previously in Short Notes to this Journal [1, 2] are described and discussed in a final paper. Two isotopes of element 108 were produced by complete fusion of207Pb and208Pb, respectively, with58Fe. Both isotopes areα-emitters. For the isotope with mass 265 threeα-decay sequences were observed. Theα-decay energy is (10.36±0.03) MeV, the half-life (1.8 −0.7 +2.2 ) ms. For the isotope with mass 264, which is the heaviest doubly even isotope known at present, the decay sequence of one atom was found. The measured half-life is (76 −36 +364 ) μs. Our experimental results point towards an enhanced stability of the heaviest elements against spontaneous fission, which was already observed for element 106.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01295182
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Depth resolution improvement in AES sputter profiling of Ni/Cr multilayers on rough substrates using two ion beams (1987)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 10 (1987), S. 7-12 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Three point depth profiling by scanning Auger microscopy and simultaneous sputtering with one ion beam and subsequent addition of a second ion beam, incident from a different direction, is applied to multilayer Ni/Cr structures deposited on a rough (roughness Ra = 2.3 μm) silicon substrate. Depending on the analysed microarea of about 1 μm diameter, depth resolutions between 25 nm and 44 nm at 125 nm sputtered depth were obtained using one ion beam. The extent of the improvement in Δz after sputtering with two ion beams is directly related to the absolute values obtained in each of the three microareas. The results are explained in terms of shadowing and redeposition effects which are diminished by the use of sputtering with two ion guns.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740100103
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...