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  • 11
    Electronic Resource
    Electronic Resource
    Springer
    Journal of radioanalytical and nuclear chemistry 129 (1989), S. 77-84 
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Rutnenium volatilized from boiling nitric acid with an induction period, which depended on both the concentrations of nitric acid and ruthenium in the solution. The lower the nitric acid concentration, the longer the induction period. A high ruthenium concentration brought about a reduction of the induction period. The rate of volatilization of ruthenium did not directly depend on the concentration of nitric acid. The addition of 0.1M ferric ion to the ruthenium solution retarded volatilization rate of ruthenium to one twentieth under boiling of the solution.
    Type of Medium: Electronic Resource
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  • 12
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In Auger electron spectroscopy, the relative sensitivities of elements, which are widely used in quantitative analysis, are primarily obtained by measurement. Nevertheless, it is very tedious to collect all relative elemental sensitivity factors for different primary electron beam energies. In view of this, we have examined methods of deriving the relative sensitivity factor for an arbitrary electron beam energy from one experimental value determined at a set energy. For this calculation, we have to consider the contributions of the ionization cross-section and the electron backscattering factor. Several formulas for the ionization cross-section and the backscattering correction factor have been reported. We have performed experiments to examine their correction accuracy. It was found that when Gryziński's formula is used as the ionization cross-section and Love-Scott's formula as the backscattering correction factor, the difference between calculated sensitivity values and measured values was found to be 〈15% for excitation energies of 〈20 keV.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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