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  • 1990-1994  (14)
  • 1965-1969
  • 1991  (14)
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  • 1990-1994  (14)
  • 1965-1969
Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5987-5988 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Many types of magneto-optical structures have been investigated to improve the MO Kerr effect. We have studied the enhancement of the MO Kerr effect in the Tb21Fe79 amorphous film having a multidielectric structure in which the TiO2 layer is sandwiched by SiNx layers. The variations of Kerr angle and reflectivity with the thickness of dielectric layer are calculated by using the reiterative formula [M. Mansuripur, G. A. N. Connel, and J. W. Goodman, J. Appl. Phys. 53, 4485 (1982)]. Experiment and simulation results are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 2593-2601 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The depletion of thin liquid films due to the combined effect of centrifugation, surface roughness, and air shear has recently been studied.While surface roughness of a rotating solid disk can be represented by deterministic curves, it has been argued that spatial random processes provide a more realistic description. Chiefly because of surface roughness, there is an asymptotic limit of retention of a thin film flowing on the rotating disk. The aim of this article is twofold. First, the effect of disjoining pressure on the retention of a thin film is investigated. It is found that incorporating disjoining pressure term has small but still appreciable effect on the asymptotic limits of lubricant retention. For a partially wetting lubricant, the two components of the disjoining pressure function tend to have opposite influence on the lubricant retention; one enhances the retention, while the other diminishes it. Second, the robustness of stochastic description of surface roughness is examined. For a given mean and variance, it is noted that different probability distributions of the surface fluctuations lead, in the absence of air shear, to significantly different asymptotic limits of thin-film retention. If air shear is incorporated, this sensitivity is substantially attenuated.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    Journal of Mathematical Physics 32 (1991), S. 845-856 
    ISSN: 1089-7658
    Source: AIP Digital Archive
    Topics: Mathematics , Physics
    Notes: The quantum R matrix for E7 and F4 are explicitly constructed for the defining representations 56 and 26 of E7 and F4, respectively. For these, Skein relations, link polynomials, and spectral parameter-dependent solutions of Yang–Baxter equation are obtained. The R matrix for the matrix elements related by the Weyl reflection has different values surprisingly.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 2558-2560 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report optical reflectivity data of several representative high Tc superconducting films before and after ion milling. A significant enhancement of optical reflectivity after ion milling of a few thousand A(ring) is observed. We observed that features associated with a-axis texture vanished after ion milling, resulting in pure c-axis films. This suggests that a-axis grains reside mostly near the surface in post-annealed high Tc superconducting films. The fact that highly oriented c-axis films can be retained even after post-annealing (for raising Tc) may be important for practical applications.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 1424-1426 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of passivation metals to protect Cu from interacting with polyamic acid precursor has been investigated by means of cross-sectional transmission electron microscopy, Rutherford backscattering spectroscopy, and resistivity measurements. Palladium or platinum, each 100 nm in thickness, was electron-beam evaporated onto Cu surface. Although not a good diffusion barrier against Cu outdiffusion, these metals can still effectively inhibit the Cu-polyamic acid interactions and, consequently, prevent the formation of Cu oxide precipitates in the polymer film. The trade-off is that, since Pd and Pt both diffuse into Cu and form solid solution alloys, the resistivity of Cu is raised significantly due to the enhanced electron-impurity scattering. In contrast, Cr serves both as a passivation metal and a good diffusion barrier without raising Cu resistivity. This is probably due to the lack of mutual solubility between Cr and Cu.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 3 (1991), S. 3194-3197 
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electromagnetic effect on the toroidal electron temperature gradient mode is investigated using local kinetic and fluid theories. It is found that the electromagnetic effect on the toroidal mode differs from that for the slab mode. For the slab mode, the electromagnetic effect gives a strong stabilization, while for the toroidal mode there is a destabilization. In particular, the modes with perpendicular wavelength comparable to the electron skin depth are destabilized by the finite electron inertia. It is shown that this contrasting result for the toroidal mode occurs mainly because the stabilizing effect of the parallel transit drift is significantly reduced by the finite electromagnetic term.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 3 (1991), S. 989-991 
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The similarity between turbulent kinetic energy and temperature spectra, previously confirmed using experimental data in various turbulent shear flows, is validated in the near-wall region using direct numerical simulation data in a fully developed turbulent channel flow. The dependence of this similarity on the molecular Prandtl number is also examined.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Oxford [u.a.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 745-747 
    ISSN: 1600-5759
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Immunogenetics 34 (1991), S. 60-61 
    ISSN: 1432-1211
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Research in nondestructive evaluation 3 (1991), S. 183-200 
    ISSN: 1432-2110
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract A numerical model is presented to calculate V(z) curves for a line-focus acoustic microscope and the specimen configuration of a thin isotropic elastic layer deposited on an isotropic elastic substrate. In this model, a Gaussian beam which is tracked through the lens into the coupling fluid, interacts with the thin-layer/substrate system. The numerical approach is based on the solution of singular integral equations by the boundary element method. The system of singular integral equations follows from the conditions at the interface of the coupling fluid and the thin layer and the interface of the thin layer and the substrate. An electrochemical reciprocity relation is used to express the voltage at the terminals of the microscope's transducer in terms of the calculated incident and back-scattered fields. V(z) curves are presented for various layer thicknesses and various combinations of the elastic constants of the layer and the substrate. The oscillations of the V(z) curves are related to the modes of wave propagation in a thin layer in contact with a solid half-space on one side and a fluid half-space on the other side. Calculated V(z) curves have also been compared with experimentally obtained curves, and good agreement is observed.
    Type of Medium: Electronic Resource
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