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  • 1990-1994  (3)
  • 1975-1979
  • 1992  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Facet formation sign in sarcoidosis: a new sign in endoscopic ultrasonography (1992)
    Springer
    European radiology 2 (1992), S. 526-531 
    Details
    ISSN: 1432-1084
    Keywords: Endoscopy ; Lymphatic system, ultrasound studies ; Lymphatic system, diseases ; Mediastinum, ultrasound studies ; Sarcoidosis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Endoscopic ultrasound was performed in 56 patients with histologically or clinically proven mediastinal or lung diseases. These 56 patients comprised 12 with sarcoidosis, 8 with lymphoma, 20 with lung cancer, 10 with oesophageal cancer, and 6 with other diseases. A 7.5 MHz electronic linear-arrayed ultrasonic endoscope was used. In 38 of the 56 patients lymph nodes were detected by endoscopic ultrasound. Eleven patients with sarcoidosis showed lymph nodes in a “facet formation” (like stones in an old stone wall), while lymph nodes in the other 27 patients were round in shape and did not form facets. The “facet formation sign”, evaluated by endoscopic ultrasound, may be a characteristic finding in sarcoidosis.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00187546
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Crack growth on elastic-plastic bimaterial interfaces (1992)
    Springer
    International journal of fracture 57 (1992), S. 365-379 
    Details
    ISSN: 1573-2673
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Finite element calculation based on finite strain theory is carried out to simulate the crack growth on bimaterial interfaces under the assumption of small scale yielding and plane strain condition. The modified Gurson's constitutive equation and the element vanish technique introduced by Tvergaard et al. are used to model the final formation of an open crack. The crack growths in homogeneous material and in bimaterials are compared. It is found from the calculation that the critical macroscopic fracture toughness for crack growth J IC is much lower in bimaterials than in homogeneous material. For bimaterial cases, the J IC of a crack between two elastic-plastic materials which have identical elastic properties with different yield strength is lower than that of a crack between an elastic-plastic material and a rigid substrate. It seems that the difference in yield strength between the dissimilar materials has more significant influence on the void nucleation and crack growth than the difference in hardening exponent.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00013059
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Elastic-plastic crack growth on plane strain bimaterial interface (1992)
    Springer
    Acta mechanica Sinica 8 (1992), S. 261-270 
    Details
    ISSN: 1614-3116
    Keywords: interface crack growth ; plane strain ; modified Gurson's model
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Finite element computation are carried out to simulate plane strain crack growth on a bimaterial interface under the assumption of small scale yielding. The modified Gurson constitutive equation and the element vanish technique introduced by Tvergaard et al. are used to model the final formation of an open crack. It is found from the calculation that the critical fracture toughness for crack growth is much lower in bimaterials than that in homogeneous material. The critical fracture toughness is strongly dependent on material properties of the bimaterial pair and the mixed mode of remote loads. The interface crack grows in the more compliant (lower hardening) material or in the weaker (lower yield strength) material. In Mode-I loading, the crack grows zigzag along the interface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02489250
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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