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  • 1995-1999  (2)
  • 1997  (2)
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  • 1995-1999  (2)
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  • 1
    ISSN: 1063-7834
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An experimental study is reported of the influence of temperature (T), electric field polarity (±E), as well as of changes in the electrode/insulator/superconductor (E/I/S) measuring system on the field effect in the ceramic (BiPb)2Sr2Ca2Cu3Ox. It has been established that at 77 K and for E⩾60 MV/m the critical current I c and conductivity of the sample increase for I〉I c, irrespective of the field polarity. For lower fields and a negative electrode potential the conductivity in an electric field may decrease. The field effect decreases with increasing temperature, to practically vanish near T c where the sample is still in superconducting state. Experiments carried out with more complex systems E/I/M/I/S and E/I/M/S (M stands for a metallic foil) support the conclusion that it is the external electric field that is responsible for the observed effects.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Physics of the solid state 39 (1997), S. 962-964 
    ISSN: 1063-7834
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The effect of γ irradiation on the mechanical characteristics and dislocation structure of slip bands in LiF crystals is studied at doses D⩽7.3×108 R. Irradiation causes a substantial increase (up to a factor of 30) in the yield stress τ y of the crystals, with τ y ∝ D 0.4 in the first approximation. The deformation shear increases in the slip bands of irradiated crystals, as do the densities of the screw and edge dislocation components, while the dislocation mean free paths decrease. Irradiation also raises the probability of twinning cross slip for screw dislocations. The observed effects are assumed to be related to the formation of a different kind of defects in the irradiated crystals, primarily clusters of implanted atoms.
    Type of Medium: Electronic Resource
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