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  • 2005-2009  (1)
  • 1995-1999  (6)
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  • 1
    Electronic Resource
    Electronic Resource
    Characterization of Nanodomains in Polymer-Derived SiCN Ceramics Employing Multiple Techniques (2005)
    Oxford, UK : Blackwell Science Inc
    Journal of the American Ceramic Society 88 (2005), S. 0 
    Details
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: A combination of methods, Bragg diffraction, small-angle X-ray scattering (SAXS), and transmission electron microscopy, is applied to the characterization of nanodomains and nanocrystals in polymer-derived ceramics (PDCs). Detailed study of two materials, silicon carbonitride (SiCN) and a SiCN–zirconia nanocomposite, is presented. The first contains domains which can be measured only by SAXS. However, the nanocrystallites of zirconia in the second material can be quantatively studied by all three techniques. In both instances, we find the SAXS to be particularly useful because these data provide detailed information regarding the size distribution of the domains and the crystallites. This information can be valuable in understanding the materials science of PDCs: e,g., the change in the distribution and the average size of the nanoclusters can be modeled to understand the kinetic mechanisms of coarsening at high temperatures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1551-2916.2004.00034.x
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    In situ carbon formation within a Si--Ti--C--O-fibre SiO2-glass composite (1997)
    Springer
    Journal of materials science 16 (1997), S. 1124-1129 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Abstracts are not published in this journal
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1018576019327
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Interface structure of a chlorine-doped Si3N4 studied by high-resolution transmission electron microscopy (1997)
    Springer
    Journal of materials science 16 (1997), S. 453-456 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Abstracts are not published in this journal
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1018552024044
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Quantitative characterization of dislocation density in α-SiC crystals after high-pressure sintering in Si3N4 matrix (1996)
    Springer
    Journal of materials science 15 (1996), S. 500-504 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00275413
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Transmission electron microscopy characterization of a fluorine-doped Si3N4 (1995)
    Springer
    Journal of materials science 14 (1995), S. 1668-1671 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00422670
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Extended X-ray absorption fine structure (EXAFS) study of secondary phases in Yb2O3-doped Si3N4 ceramics (1997)
    Springer
    Journal of materials science 32 (1997), S. 369-374 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Liquid-phase sintered Si3N4 doped with Yb2O3 as a sintering aid was characterized by both transmission electron microscopy and extended X-ray absorption fine structure (EXAFS) measurements. Structural information about the secondary phases was obtained with an emphasis being placed on the evaluation of EXAFS data. Two Si3N4 samples were processed which contained either 5 vol% or 10 vol% Yb2O3 as sintering additive. After sintering, only an amorphous secondary phase was observed in the material doped with 5 vol% Yb2O3. The material with the higher Yb2O3 volume fraction underwent a further heat treatment after the densification, in order to crystallize pockets of the secondary phase. This heat treatment resulted in the formation of Yb2Si2O7 at multi-grain junctions, with however, amorphous phases remaining along the grain and phase boundaries. The EXAFS data obtained from the two doped Si3N4 materials were compared with reference spectra obtained on pure Yb2O3 and synthetic Yb2Si2O7. No residual Yb2O3 was determined in the doped Si3N4 materials, independent of the Yb2O3 volume fraction. Compared to synthetic Yb2Si2O7, the secondary phase formed in the 10 vol% Yb2O3 containing material showed only subtle changes in the EXAFS data. A clear distinction between purely amorphous and a combination of crystalline plus amorphous Yb secondary phases was possible, when both doped Si3N4 materials were compared. However, no distinction between the glass phase present at triple junctions and the amorphous residue along grain/phase boundaries was feasible, since a full numerical data evaluation could not be performed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1018501316195
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  • 7
    Electronic Resource
    Electronic Resource
    Effect of interface chemistry on the mechanical properties of Si3N4-matrix composites (1999)
    Springer
    Journal of materials science 34 (1999), S. 1667-1680 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The effect of systematic modifications in the chemistry of the phase-boundary film on the macroscopic mechanical properties of Si3N4-matrix composites was investigated. Model composite materials, containing SiC or WC platelets, were prepared and only the bulk anion composition of the glassy-SiO2 intergranular phase was varied by adding increasing amounts of fluorine to the material. Detailed material characterizations by high-resolution electron microscopy (HREM) and Raman spectroscopy on both undoped and F-doped composites allowed to derive a structural model of the phase-boundary film as well as to evaluate the average microscopic stresses acting on it. In addition, high-temperature internal friction measurements provided an estimate of the grain-boundary relaxation temperature as a function of the F content. Noticeable variations of both elastic modulus and fracture energy of the composite were detected upon F addition, which were related to a spontaneous process of phase-boundary microcracking upon cooling. A threshold of the F-content was found for microcrack formation and its existence is theoretically explained according to a percolation process of non-bridged SiO4-tetrahedra, which arises from the incorporation of F into the intergranular film network.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1004597120686
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    Paper (German National Licenses)
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