ISSN:
1572-9605
Keywords:
Submillimeter wave
;
laser
;
reflection
;
surface resistance
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Submillimeter wave laser reflection measurements of surface resistance can provide improved capability in the combination of sensitivity, spatial resolution, and frequency range. We have made reflectivity measurements on metals at 1630 GHz with an uncertainty of less than 0.3%. This sensitivity corresponds to a measurement sensitivity for surface resistance of 0.3 Ω. Assuming anf 2 frequency scaling of high-temperature superconductor surface resistance from the microwave to the terahertz frequency range, this sensitivity corresponds to about 1 ×10−5 Ω at 10 GHz. Capability for 10−7 Ω sensitivity could eventually be possible. Preliminary submillimeter wave reflection measurements of a YBCO thin film have been made with a sensitivity of 1%. Submillimeter wave reflectometry can make it possible to determine the spatial dependence of surface resistance in a wide range of material sizes and shapes. The spatial resolution could be on the order of 0.3–0.5 mm.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00618139
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