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  • 2000-2004  (1)
  • 1985-1989  (6)
  • 1980-1984  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 197-205 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An experimental set up for X-ray diffraction experiments at grazing incidence is described. Adjustment and calibration procedures are defined. It allows identification of phases at increasing depth in thin films, with a resolution of 50 nm, by varying the incidence angle above the critical angle of specular reflection. Some examples are given to illustrate the potential of the technique in studies of the effects of surface treatments on bulk specimens. The examples are implantation films with thicknesses between 50 and 500 nm, and also rough films resulting from friction tests of these implanted surfaces.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 22 (1987), S. 1087-1096 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Several spectroscopies analysing the composition and chemical nature of thin films (Rutherford backscattering spectrometry, nuclear reaction analysis, secondary ion mass spectroscopy, X-ray photoelectron spectroscopy) were combined with a specially designed technique of X-ray diffraction at grazing incidence on bulk samples, in order to characterize Ti1−x N x films of nearly homogeneous composition obtained by ion implantation at several energies. Differences in the nature of the phases observed, with respect to previous TEM studies on thin foils, are discussed in terms of radiation-enhanced diffusion and of thermal dissipation of the ion-beam power. The distribution of nitrogen atoms, defects and phases as a function of the nitrogen concentration are also correlated with changes in depth profiles of hardness measured by a submicroscopic indentation test.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 20 (1985), S. 1480-1493 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The wear and friction resistance of nickel surfaces implanted with increasing doses of boron or phosphorous was investigated, with a pin-on-disc geometry and a 100C6 steel rider, in air. The seizure resistance is drastically improved when the implanted dose is sufficiently high to give an amorphous Ni-B or Ni-P layer.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 24 (1989), S. 1693-1699 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract This paper presents the first results on the effect of nitrogen implantation on hydrogen permeation in steels. Nitrogen can modify superficially the steel's chemistry and/or microstructure depending on the fluence and thereby affect the processes of hydrogen diffusion and trapping. The implantations were performed on low carbon steel specimens with different nominal doses (1% to 10% and 33% nitrogen in a superficial layer of approximately 100 to 120 nm). The corresponding microstructures were characterized and permeation tests were conducted at room temperature in a double electrolytic cell. The nitrogen implanted layers on iron affects the electrochemical behaviour of the surface and the permeation in the material. This effect depends on the nitrogen concentration in the layer and on the corresponding microstructure. A continuous Fe2N layer acts as an efficient barrier to hydrogen entry and permeation when the layer is located on the entry face of the permeation membrane. This effect is stronger when the implanted layer is on the downstream face of the membrane. The low permeability values are mainly attributed to a lower hydrogen solubility in the implanted layer, whereas hydrogen trapping on defects and nitride precipitates delay hydrogen penetration.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract. Ion irradiation or heat treatments in vacuum of gel films prepared from mixtures of triethoxysilane with Fe and Ni nitrates permits to obtain a precipitation of metal particles in a glassy matrix, because these gels contain hydrido groups able to reduce Fe3 + and Ni2 + ions. The precipitation under irradiation is ascribed to the electronic excitations produced by the ions and the volume of metallic phase increases in proportion to the amount of energy transferred to electrons. The metal particles exhibit a narrower range of sizes than in films submitted to heat treatments in vacuum. Experiments of electron spin resonance indicate that the magnetic behavior of irradiated films is affected by a stress-induced anisotropy field. Films containing 3 to 7 at% Fe are in a superparamagnetic state in a given range of temperatures while the magnetic moments of nickel particles in films with similar metal contents exhibit a stronger correlation, due to a larger yield of precipitation and to the stress.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 37-45 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The purpose of the present paper is to discuss the possibilities and limits of three analytical techniques - namely RBS, NRA and SIMS - in studies of the worn surfaces of thin films. The chosen examples are not the most simple since the obtainable data by means of each technique are limited by the nature of the films, riders and atmosphere of friction tests. Surfaces of Ti or Fe implanted with N ions were worn in air against steel or silica balls, using a tribometer specially conceived for further surface analysis. Different mechanisms of oxidative wear have been shown based on the data of the above techniques and punctual complementary analysis by XPS or TEM. They are a diffusion of oxygen in the bulk of Ti—N, Fe—N solid solutions, through short paths and cracks in Ti2N, TiN compounds. In any case, the N diffusion during friction, which has been often invoked to explain the durable wear resistance of implanted metals, has not been observed.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 14 (1989), S. 537-542 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Ion implantation and Rutherford backscattering are combined to study: (1)the effects of caesium doping and caesium bombardment on SIMS emission yields,(2)the carbon emission yield as a function of its concentration in Ti1-xCx films. Quantitative analysis by SIMS of such films can be performed with an accuracy of 5%.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 6 (1984), S. 174-183 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Secondary ion mass spectrometry and glow discharge optical spectrometry are used to determine the depth profiles of Ni and Fe matrices implanted with B and P. These measurements enable the emission yields of secondary ions (for SIMS) or photons (for GDOS) emitted under ion bombardment to be quantified and consequently the implanted samples can be used as standards. The profiles obtained by both methods are in good agreement and independant of the surface roughness. They are compared to real distributions determined by Rutherford backscattering (RBS) and to theoretical ones predicted by the model of Winterbon, Sigmund and Sanders; the concentrations measured at the maximum of the distribution are smaller then the theoretical ones and the experimental profiles are wider than those given by the theory. The causes of the alterations in the profiles are discussed and the surface contamination of the samples is studied by mean of GDOS profiles.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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