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  • 2000-2004  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic imaging of a buried SmCo layer in a spring magnet (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7165-7167 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Images of the magnetic domain structure in a 1600 Å thick buried SmCo layer of a Fe/SmCo spring magnet were obtained using a newly developed x-ray microprobe. This probe combines circularly polarizing optics with a microfocusing Fresnel zone plate to obtain a highly polarized, small cross-section x-ray beam in the energy range between 5 and 10 keV. X-ray magnetic circular dichroism was used to provide contrast between different magnetic domains as a function of the externally applied magnetic field. The obtained images show domain walls not oriented parallel to the external field but correlated with structural features in the sample. A plausible explanation is pinning of domain walls at stacking faults in the layer. The range of external fields for which the magnetic reorientation of a particular microscopic domain occurred was much smaller than the range measured for a macroscopic hysteresis loop, indicating that the reorientation is due to growth of domains developed at local nucleation points. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1360391
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  • 2
    Electronic Resource
    Electronic Resource
    Characterization of a microfocused circularly polarized x-ray probe (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2386-2390 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4×2 μm2 by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe2. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150625
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    A unique polarized x-ray facility at the Advanced Photon Source : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1408-1410 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: To use the unique element-specific nature of polarized x-ray techniques to study a wide variety of problems related to magnetic materials, we have developed a dual-branch sector that simultaneously provides both hard and soft x-ray capabilities. This facility, which is located in sector 4, is equipped with two different insertion devices providing photons in both the intermediate (0.5–3 keV) and hard x-ray regions (3–100 keV). This facility is designed to allow the simultaneous branching of two undulator beams generated in the same straight section of the ring. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1435814
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    Paper (German National Licenses)
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