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  • 1
    Electronic Resource
    Electronic Resource
    A unique polarized x-ray facility at the Advanced Photon Source : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1408-1410 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: To use the unique element-specific nature of polarized x-ray techniques to study a wide variety of problems related to magnetic materials, we have developed a dual-branch sector that simultaneously provides both hard and soft x-ray capabilities. This facility, which is located in sector 4, is equipped with two different insertion devices providing photons in both the intermediate (0.5–3 keV) and hard x-ray regions (3–100 keV). This facility is designed to allow the simultaneous branching of two undulator beams generated in the same straight section of the ring. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1435814
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  • 2
    Electronic Resource
    Electronic Resource
    Characterization of a microfocused circularly polarized x-ray probe (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2386-2390 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4×2 μm2 by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe2. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150625
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  • 3
    Electronic Resource
    Electronic Resource
    Performance of the advanced photon source 1-BM beamline optics (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 4457-4462 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Bending magnet beamlines at third-generation synchrotron sources combined with well-designed optics offer unique capabilities for providing high x-ray fluxes into relatively small focal spots. This article provides a description of the x-ray optics used in the Advanced Photon Source 1-BM beamline. The performance of these optics in terms of the delivered flux ( 9×1011 ph/s/100 mA at 10 keV), energy resolution [ΔE/E(approximate)1.5×10−4 with Si(111)], and focusing properties (spot size (approximate)0.25×0.60 mm) is compared with that expected from ideally reflecting and shaped optics. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150096
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  • 4
    Electronic Resource
    Electronic Resource
    Beam size measurement of the stored electron beam at the APS storage ring using pinhole optics : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3368-3368 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Beam sizes of the stored electron beam at the APS storage ring were measured using pinhole optics and bending magnet x-rays in single-bunch and low-current mode. A white-beam pinhole of 25 μm and a fast x-ray imaging system were located 23.8 m and 35.4 m from the source, respectively. The x-ray imaging system consists of a CdWO4 scintillation crystal 60 μm thick, an optical imaging system, and a CCD detector. A measurement time of a few tenths of a second was obtained on a photon beam of E(approximately-greater-than)30 keV produced from a 7-GeV electron beam of 2-mA current. The resolution of the pinhole imaging system was evaluated to be 16 μm. The measured vertical and horizontal sizes of the electron beam were in reasonable agreement with the expected values. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147370
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetic imaging of a buried SmCo layer in a spring magnet (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7165-7167 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Images of the magnetic domain structure in a 1600 Å thick buried SmCo layer of a Fe/SmCo spring magnet were obtained using a newly developed x-ray microprobe. This probe combines circularly polarizing optics with a microfocusing Fresnel zone plate to obtain a highly polarized, small cross-section x-ray beam in the energy range between 5 and 10 keV. X-ray magnetic circular dichroism was used to provide contrast between different magnetic domains as a function of the externally applied magnetic field. The obtained images show domain walls not oriented parallel to the external field but correlated with structural features in the sample. A plausible explanation is pinning of domain walls at stacking faults in the layer. The range of external fields for which the magnetic reorientation of a particular microscopic domain occurred was much smaller than the range measured for a macroscopic hysteresis loop, indicating that the reorientation is due to growth of domains developed at local nucleation points. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1360391
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  • 6
    Electronic Resource
    Electronic Resource
    A high energy phase retarder for the simultaneous production of right- and left-handed circularly polarized x rays (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1970-1973 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have fabricated and characterized the performance of a monolithic Ge Bragg–Laue phase retarder capable of simultaneously producing both right- and left-handed circularly polarized x rays. The energy range of operation of the phase retarder is between 50 and 100 keV making it well suited to the measurement of spin-dependent Compton profiles within the impulse approximation, primarily because of the increased momentum resolution and larger Compton scattering cross section available at these higher incident energies. Although the phase retarder was optimized for operation at 86 keV, it can produce highly circularly polarized x rays over a substantial energy range. The performance of the phase retarder was tested via magnetic Compton scattering measurements on an Fe sample at the undulator A of the Advanced Photon Source. It was found to perform well in terms of flux and degree of circular polarization thereby greatly reducing the data collection times required for this inherently weak scattering process. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148882
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  • 7
    Electronic Resource
    Electronic Resource
    Germanium X-ray phase plates for the production of circularly polarized X-rays
    Amsterdam : Elsevier
    Nuclear Instruments and Methods in Physics Research Section A: 347 (1994), S. 128-133 
    Details
    ISSN: 0168-9002
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1016/0168-9002(94)91868-6
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