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  • 1995-1999  (12)
  • 1985-1989  (1)
  • Chemistry  (9)
  • Allotetraploid  (4)
  • Ethanol
  • 1
    ISSN: 1432-2242
    Keywords: Key wordsAegilops ; Allotetraploid ; Diploidization ; Pairing control ; Synaptonemal complex
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Chromosome pairing behaviour of the allotetraploid Aegilops species sharing the D genome, Ae. crassa (DDMM), Ae. cylindrica (DDCC) and Ae. ventricosa (DDNN), was analyzed by electron microscopy in surface-spread prophase-I nuclei. Synaptonemal-complex analysis at zygotene and pachytene revealed that synapsis in the allotetraploids was mostly between homologous chromosomes, although a few multivalents were also formed. Only homologous bivalents were observed at metaphase-I. It is concluded that the mechanism controlling bivalent formation in these species acts mainly at zygotene by restricting pairing to homologous chromosomes, but also acts at pachytene by preventing chiasma formation in homoeologous associations. These observations are discussed in relation to mechanisms of diploidization of polyploid meiosis.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-2242
    Keywords: Aegilops ; Allotetraploid ; Diploidization ; Pairing control ; Synaptonemal complex
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Allotetraploid Aegilops species sharing the U genome, Ae. columnaris (UUMM), Ae. ovata (UUMM), Ae. triaristata (UUMM), Ae. triuncialis (UUCC) and Ae. variabilis (UUSS), regularly form bivalents at metaphase I of meiosis. The pattern of zygotene and pachytene pairing was analyzed by whole-mount surface-spreading of synaptonemal complexes under the electron microscope. The data indicated that at the zygotene stage the chromosomes were almost exclusively associated as bivalents; only a few multivalents (7%) were observed. These observations are discussed in relation to mechanisms of diploidization of polyploid meiosis.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1432-2242
    Keywords: Aegilops ; Allotetraploid ; Diploidization ; Pairing control ; Synaptonemal complex
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Chromosome pairing behaviour of the allotetraploid Aegilops species sharing the D genome, Ae. crassa (DDMM), Ae. cylindrica (DDCC) and Ae. ventricosa (DDNN), was analyzed by electron microscopy in surfacespread prophase-I nuclei. Synaptonemal-complex analysis at zygotene and pachytene revealed that synapsis in the allotetraploids was mostly between homologous chromosomes, although a few multivalents were also formed. Only homologous bivalents were observed at metaphase-I. It is concluded that the mechanism controlling bivalent formation in these species acts mainly at zygotene by restricting pairing to homologous chromosomes, but also acts at pachytene by preventing chiasma formation in homoeologous associations. These observations are discussed in relation to mechanisms of diploidization of polyploid meiosis.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1432-2242
    Keywords: Key wordsAegilops ; Allotetraploid ; Diploidization ; Pairing control ; Synaptonemal complex
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract Allotetraploid Aegilops species sharing the U genome, Ae. columnaris (UUMM), Ae. ovata (UUMM), Ae. triaristata (UUMM), Ae. triuncialis (UUCC) and Ae. variabilis (UUSS), regularly form bivalents at metaphase I of meiosis. The pattern of zygotene and pachytene pairing was analyzed by whole-mount surface-spreading of synaptonemal complexes under the electron microscope. The data indicated that at the zygotene stage the chromosomes were almost exclusively associated as bivalents; only a few multivalents (7%) were observed. These observations are discussed in relation to mechanisms of diploidization of polyploid meiosis.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Angewandte Makromolekulare Chemie 240 (1996), S. 67-81 
    ISSN: 0003-3146
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Standard epoxy resins have good mechanical properties, but their prolonged low temperature curing time limits their potential use in clinical applications as well as in many industrial applications. A fast-curing epoxy-episulfide resin has been developed. The gel time of epoxy-episulfide made from EPONTrade mark of Shell Chemical Company. 828 ranges from 2 to 10 minutes by changing the ratio of the ingredients. The heat of reaction of this system is low, resulting in low cure shrinkage. Water absorption of the episulfide network is low. The epoxy-episulfide system cured with polyamide curing agent V-40 exhibits two transition temperatures, at about 85°C and 130°C, as shown in dynamic mechanical analysis data. In order to solve the long term stability problem of the above episulfides, and also the mixing problem, a lower viscosity resin, Eponex, was used to make Eponex-sulfide. Eponex-sulfide systems show promise in that they remain in a stable liquid form without epoxy. The other advantages appear to be retained.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 8 (1998), S. 1-8 
    ISSN: 1057-9257
    Keywords: electrodeposition ; copper-indium-selenide ; thin films ; layer-by-layer deposition ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: The electrochemical bath used for growing device-quality CIS (CuInSe2) thin films by co-deposition as well as layer-by-layer (LBL) deposition was characterised and optimised with respect to the film properties. The bath composition was varied by changing the Cu, In and Se ion concentrations in specific ratios in both co-deposition and LBL deposition. The film properties were analysed using techniques such as SEM (scanning electron microscopy), EPMA (electron probe microanalysis), AES (Auger electron spectroscopy) and XRD (X-ray diffraction). The structural, morphological and compositional properties of the films were characterised and their variation is attributed to the bath composition and growth conditions. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Advanced Materials for Optics and Electronics 5 (1995), S. 11-17 
    ISSN: 1057-9257
    Keywords: CdS ; chemical deposition ; complexing agent ; sulfurising agent ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: The growth modes of CdS thin films on glass in a chemical bath were analysed using scanning electron microscopy and optical microscopy. The results of these studies show that the film growth occurs by ion-by-ion condensation and by colloidal particles of CdS adhering to the substrate. Both mechanisms are operative from the initial stages of film growth. The predominance of one or other of these two growth modes depends on the abundance of Cd and S ions present in the solution, which is determined by the amount of complexing and sulphurising agents and ammonia used for the controlled release of Cd and S ions into the solution. The growth mode influences the optical properties of the films.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 0142-2421
    Keywords: multilayers ; ZrN ; BN ; AES ; RBS ; depth profiling ; factor analysis ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Multilayers of ZrN/BN have been deposited on Si(100) using a double ion beam sputtering system. The multilayers have been characterized by transmission electron microscopy, Rutherford backscattering spectroscopy and Auger electron spectroscopy (AES) depth profiles in order to get a quantitative analysis of the components and contaminants in the different layers and at their respective interfaces. Factor analysis is used to deconvolute the different chemical states of the components and to identify secondary phases and compounds that determine the quality of the multilayer. Two secondary phases have been observed at the different interfaces: one is associated with the incorporation of oxygen, mainly in the zirconium layer, and leads to the formation of ZrNxOy. In addition we have observed that Ar bombardment during the AES depth profile leads to the formation of ZrBxNy in all the interfaces. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 1016-1026 
    ISSN: 0142-2421
    Keywords: XPS analysis ; nanoparticles ; XAS ; EELS ; quantitative characterization of powders ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: For the present study we have considered powders made up of small particles (〈1 μm) coated with a uniform overlayer. Different models have been developed to predict the elemental compositions in this kind of sample by x-ray photoelectron spectroscopy (XPS) and absorption spectroscopies: electron energy-loss spectroscopy (EELS) and x-ray absorption spectroscopy (XAS). Isolated spherical or cubic particles, aggregated spherical particles and continuously layered models have been considered to take different possible textures of the samples into account. Theoretical curves have been compared to experimental data obtained for Al2O3/Al ultrafine powders made up of Al metal cores coated with an Al2O3 overlayer. The dependence of both photoelectron and absorption spectroscopy analysis on overlayer thickness and sample texture as a function of particle size is discussed. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 292-294 
    ISSN: 0142-2421
    Keywords: XPS ; Auger parameter ; TiO2 ; catalyst ; chemical state plot ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The analysis by XPS of TiO2 deposited on different substrates (SiO2, MgO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is possible with a chemical state plot. The implications of the existence of such shifts for the characterization of catalysts are discussed. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
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