ZIB

Treffer pro Seite

Treffer 1 - 1 | 1 Treffer

Sortierung

Digitale Medien

Determination of the mean size of submicron particles by electron probe microanalysis (1995)

Berner, A. ; Levin, I. ; Klinger, L. ; [weitere]

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 24 (1995), S. 13-18

zur Merkliste hinzufügen auf der Merkliste

Details

ISSN: 0049-8246

Schlagwort(e): Chemistry ; Analytical Chemistry and Spectroscopy

Quelle: Wiley InterScience Backfile Collection 1832-2000

Thema: Physik

Notizen: A method for the determination of the mean size of submicron particles randomly distributed in a matrix by electron probe x-ray microanalysis (EPMA) is described. The method is based on an analysis of variance of the characteristic x-ray intensity from an element contained only in the particle. Analytical expressions relating this variance to the mean size of the particles were derived and the method was validated using test samples. The present technique can be used with a conventional x-ray microanalyser for the rapid determination of the mean size of submicron particles.

Zusätzliches Material: 5 Ill.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1002/xrs.1300240105

Permalink

Bibliothek	Standort	Signatur	Band/Heft/Jahr	Verfügbarkeit

Andere fanden auch interessant ...

Artikel (Nationallizenzen)

Volltext

Treffer 1 - 1 | 1 Treffer