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  • 11
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3336-3338 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: We have observed a conversion of step configuration of 3.5° miscut Si(001) surface after depositing several monolayers of Ge by using a scanning tunneling microscope. For a 3.5° miscut Si(001) surface, terraces are spaced by double-atom height steps and all dimer rows, either on the upper terrace or on the lower terrace of a step, are normal to the step edge, defined as single-domain (1×2) surface. After depositing 2 ML of Ge, the surface is still single domain, but dimer rows have changed their direction, running parallel to the step edge and single domain (2×1) appeared. The reason for such conversion is attributed to the strain that existed on the epilayer of Ge. © 1996 American Institute of Physics.
    Materialart: Digitale Medien
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  • 12
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 628-630 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Reflection high energy electron diffraction (RHEED) intensity measurements reveal that the strain in a Si1−xGex layer on a vicinal Si(001) surface converts a (1×2) domain dominated step configuration to a (2×1) domain dominated one. The dependence of the effect on the Ge content is similar to the dependence of the critical thickness of the pseudomorphic growth of Si1−xGex layers on Ge content. No conversion effect has been observed on exact Si(001) substrates. © 1996 American Institute of Physics.
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  • 13
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 1555-1557 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: We report a photoluminescence study of SiGe quantum dots formed by one, two, and five periods of Si[8 monolayer (ML)]/Ge(4 ML) superlattices. The peak of photoluminescence from one Ge layer is at 0.95 eV, but the one from two and five periods of superlattices jump to about 1.2 eV. © 1997 American Institute of Physics.
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  • 14
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 446-448 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: It is found that the SiGe alloy self-organizers into uniform quantum dots embedded in the Si layer during the growth of a strained Si/Ge short period superlattice on a Si(001) substrate at a temperature of 800 °C by molecular beam epitaxy. The peak of photoluminescence from the quantum dots is at an energy higher than the band gap of Si. The intensity is two orders of magnitude higher than that of SiGe/Si quantum well. © 1997 American Institute of Physics.
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  • 15
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 1676-1678 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Low-temperature growth and subsequent rapid thermal anneal were used to intermix Al and Ga atoms in AlGaAs/GaAs multiple quantum wells (QWs). The intermixed samples were characterized by photoluminescence (PL) spectroscopy, and the observed blue shifts in PL energies are interpreted as the result of modification of the QW shape due to the enhanced Al-Ga interdiffusion in the samples. The enhancement of interdiffusion was found to be strongly dependent on the growth and annealing conditions. In addition, the saturation behavior of Al-Ga interdiffusion was also observed. © 1997 American Institute of Physics.
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  • 16
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 3160-3162 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Relaxed GexSi1−x epilayers with high Ge fractions but low threading dislocation densities have been successfully grown on Si (001) substrate by employing a stepped-up strategy and a set of low-temperature GeySi1−y buffers. We show that even if the Ge fraction rises up to 90%, the threading dislocation density can be kept lower than 5×106 cm−2 in the top layers, while the total thickness of the structure is no more than 1.7 μm. © 1998 American Institute of Physics.
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  • 17
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 1366-1368 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: At a medium substrate temperature of 400 °C and a lower As flux, we have grown an ultrafast AlGaAs/GaAs photorefractive multiple quantum well (MQW) structure by molecular beam epitaxy. The as-grown sample exhibits strong photorefractive effect under the transverse Frantz–Keldysh geometry. A peak electroabsorption of 2100 cm−1 is measured in the as-grown sample in an 11 kV/cm dc electric field, and the peak photorefractive diffraction efficiency can be 1.2%. After postgrowth annealing, the photorefractive effect becomes weak and disappears in samples annealed above 700 °C. Using optical transient current spectroscopy, deep levels are measured in these samples. It is found that deep levels are stable against annealing until 700 °C. Using a pump-probe technique, carrier lifetimes are measured at room temperature. We find that the as-grown sample has a lifetime of 20 ps, while the 700 °C annealed sample has a lifetime of more than 200 ps. The ultrafast lifetime in the as-grown sample is caused by point defects, not by As clusters. Our result show that AlGaAs/GaAs MQW structure grown around 400 °C has better performance of the photorefractive effect. © 1999 American Institute of Physics.
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  • 18
    Digitale Medien
    Digitale Medien
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 6546-6552 
    ISSN: 1089-7690
    Quelle: AIP Digital Archive
    Thema: Physik , Chemie und Pharmazie
    Notizen: An experimental study of poly(N-vinyl-2-pyrrolidone) (PVP) in water solution has been carried out by using the surface laser light scattering (SLLS) technique. The concentration dependence data of the peak frequency and linewidth are obtained from the SLLS spectra of the PVP/water solutions with two PVP molecular weights over a wide concentration range varying from the dilute to semidilute regime. The equilibrium surface tension of the solution is also measured as a function of polymer concentration and molecular weight. In the dilute solution, the peak frequency and surface tension show only a small decrease with increasing concentration. However, in the semidilute concentration regime, the surface tension and the frequency shift decrease rapidly with increasing concentration, accompanied by the dramatic increase in the spectral linewidth. The surface tension, SLLS spectral peak frequency and linewidth show an important molecular weight dependence. Over the entire concentration range investigated, the SLLS data of the PVP/water solutions do not show evidence of the capillary to Rayleigh wave evolution. © 1996 American Institute of Physics.
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  • 19
    Digitale Medien
    Digitale Medien
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 6052-6059 
    ISSN: 1089-7690
    Quelle: AIP Digital Archive
    Thema: Physik , Chemie und Pharmazie
    Notizen: A detailed light scattering study of polystyrene (PS) in diethyl malonate (DEM) semidilute solution has been carried out. DEM is a theta solvent for PS at 32 °C. Dynamic light scattering measurements carried out at temperatures closed to the theta temperature show only a diffusion mode in the intensity autocorrelation function; no slow modes are found in the semidilute PS/DEM solution with concentration up to more than 18 times the overlap concentration. For this system, the mutual diffusion coefficient is found to be mainly determined by the osmotic modulus, with the solution stress modulus making a negligible contribution. A slowing down of the mutual diffusion coefficient as the temperature approaches the critical temperature (at the critical concentration) is observed. These results show that despite considerable chain entanglements existing in the semidilute/concentrated PS/DEM solution, no viscoelastic slow modes are found. These results are not in agreement with the existing literature data for the same system. The absence of the viscoelastic modes is interpreted as due to the fact that PS and DEM are isopycnic and the coupling of concentration fluctuations and the solution stress modulus is negligible for isopycnic polymer solutions, in accordance with a theory recently developed in this laboratory. © 1996 American Institute of Physics.
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  • 20
    Digitale Medien
    Digitale Medien
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 109 (1998), S. 6103-6109 
    ISSN: 1089-7690
    Quelle: AIP Digital Archive
    Thema: Physik , Chemie und Pharmazie
    Notizen: The effects of surface tension, surface dilational modulus, stress relaxation time, and shear stress modulus on the surface laser light scattering (SLLS) spectrum of polymer solutions are investigated. The capillary wave component is significantly affected by both the stress relaxation time and the amplitude of the shear stress modulus. At moderate concentration, before crossing over to the elastic regime, a strong quasielastic component dominates the SLLS spectrum in polymer solution. In the viscoelastic regime, the capillary wave component of the SLLS spectrum is suppressed by the increase of the surface dilational modulus. The decrease of the surface tension gives rise to an effect similar to that caused by increasing the dilational modulus. However, at high polymer concentration in the elastic regime, the dilational modulus has only a negligible effect on the SLLS spectrum, in contrast to the effect of surface tension. © 1998 American Institute of Physics.
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