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  • 1995-1999  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1343-1345 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using ex situ atomic force microscopy, nanometer-scale islands were observed on CdS(0001)A surfaces to appear after deposition of small amounts of CdSe. The sizes of these islands are similar to those reported in atomic force microscopy (AFM) studies of uncapped CdSe/ZnSe structures. Investigations by force modulation microscopy and photoluminescence spectroscopy show, however, that they are difficult to assign to a CdSe Stranski–Krastanow growth. Instead, AFM points to an onset of the island formation with the exposure of the samples to atmosphere. By use of electron microprobe analysis, it is suggested that these islands consist of selenium. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The microstructure of different Fe-Cr-Al alloys in the composition range of 0 to 18 at % Cr and 7 to 25 at % Al was investigated by transmission electron microscopy (TEM). By systematically varying the compositions, the location of the order-disorder transition was determined. Dark field images confirmed that many samples consisted of a two-phase mixture of small DO3-ordered particles in a disordered A2 matrix. The mottled contrast exhibited by some samples and sometimes taken as a proof of the existence of ordered particles is shown to be produced by an artefact due to the TEM sample preparation.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Colloid & polymer science 277 (1999), S. 673-679 
    ISSN: 1435-1536
    Keywords: Key words Polystyrene ; Sulfonation ; Surface analysis ; Adsorption ; Wet modification
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract  The sulfonation of polystyrene (PS) films with 50 and 96% sulfuric acid as a function of time is presented. In contrast to previous literature reports, we showed that the treatment of PS films even with dilute sulfuric acid yields sulfonated surfaces after reaction times of 30 s–1 h. The hydrophilicity of the modified PS increased considerably in comparison to the unreacted PS films. X-ray photoelectron spectroscopy yielded evidence for the sulfonation of PS at the surface. Unreacted spin-coated PS films were very smooth, while modified PS showed some clumps dispersed on a flat surface, as analyzed by atomic force microscopy. The surface morphology was identified as a phase-separated system composed of domains of unreacted PS and a matrix of sulfonated PS by fluorescence microscopy using the positively charged dye rhodamine B. The adsorption of the polycation diallyldimethylammonium chloride on the sulfonated PS surface could be detected. The thickness of the adsorbed polycation was 2.2 nm.
    Type of Medium: Electronic Resource
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