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  • 1
    Electronic Resource
    Electronic Resource
    A step gradient system for microcolumn liquid chromatography based on a multiple-loop valve (1990)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Microcolumn Separations 2 (1990), S. 84-87 
    Details
    ISSN: 1040-7685
    Keywords: microcolumn liquid chromatography ; gradient elution ; multiple-loop valve ; nucleosides ; Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Notes: A new gradient elution system for microcolumn liquid chromatography is presented and evaluated. A multiple-loop valve system facilitates a reproducible, stepwise addition of the mobile phase at low-microliter-per-minute flow rates. The system is amenable to automation. Gradient precision has been evaluated under various operational conditions. An optimized system yielded standard deviations in retention times of less than 0.5 on runs over 2 h.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/mcs.1220020208
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Reverse-phase liquid chromatography/electrospray-ionization Fourier-transform mass spectrometry in the analysis of peptides (1994)
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 8 (1994), S. 513-516 
    Details
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Electrospray ionization (ESI) in combination with Fourier-transform mass spectrometry (FTMS) gives both highly accurate mass analysis of peptides with external calibration and high resolution for charge-state determination of an ion from the naturally occurring isotopic peaks. Liquid chromatographic (LC) separation of peptides is important for the analysis of complex mixtures. High-resolution, high accuracy measurement of the molecular ions of the mix of peptides has been achieved with LC/ESI-FTMS. Examples are given to show both the reproducibility of mass accuracy over replicate analyses and to show the utility of broadband analysis of a gradient separation of peptides. The high mass accuracy and resolution of FTMS was uncompromised for the direct analysis of chromatography peaks.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/rcm.1290080704
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Characterization of ni on si wafers: Comparison of surface analysis techniques (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 131-137 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The need for improved characterization of materials used in the fabrication of semiconductor devices has been driven by the semiconductor industry's desire to increase device densities on substrate. This need is reflected in the analytical surface science community by efforts to develop methods for detection of trace impurities on semiconductor substrates at extremely low levels. With improvements in standard techniques continually occurring, and with new methods of trace analysis always being developed, it is important to assess the relative abilities of the suite of surface analysis techniques available for materials characterization and to develop well-characterized standard samples for these comparisons. This paper reports on a collaborative effort to review the capabilities of several approaches to trace surface analysis. As a test case, Ni contamination of Si wafers in the dose range 1014-1010 cm-2 has been chosen. The emphasis of this paper will be on the capabilities of SARISA (surface analysis by resonant ionization of sputtered atoms) as an example of laser post-ionization secondary neutral mass spectrometry for the detection of contaminants in the near-surface region. Results on analyses of the same standard samples by other techniques will also be presented. These techniques include total reflection x-ray fluorescence and heavy ion backscattering spectrometry. The results of this comparison show that there are several techniques that can accurately determine metal contaminations on Si wafers in this concentration range and that the method of choice depends on other considerations, such as speed or accuracy of analysis.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210211
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    Paper (German National Licenses)
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