ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
With the advent of layered synthetic microstructure (LSM) technology, high-reflectivity narrow-band XUV filters, and LSM coated gratings become available, thus making possible normal-incidence high-throughput devices in the 10–200 A(ring) range. Therefore it may become feasible to measure rapid (τ∼10−6 s) fluctuations of the electron density and temperature in the hot central region of the tokamak plasma, by measuring fluctuations on the L-shell charge-state line emissions. We present and discuss the linear dependence of correlated line intensity fluctuations on local T˜e and ñe. Various configurations for the proposed measurements are presented and evaluated.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141735
Permalink