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  • 1990-1994  (9)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 485-491 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An array-type universal profile function for powder-pattern fitting is described. It is defined as an array of unknown parameters representing the profile heights at discrete angular steps. The unknown parameters are determined during least-squares fitting together with the integrated intensity, the peak position, the peak width and background parameters. The function has been applied to profile fitting in a small 20 range, and has better R-factors than the pseudo-Voigt and Pearson VII functions. This new function has some important advantages: it can model any complex profile shape, which would be difficult to describe by a smoothly varying analytical-type function; it generally gives a better fit and thus more precise and accurate analysis than currently used analytical-type functions; and it can be applied to the data of all radiation sources including conventional X-rays, synchrotron radiation and time-of-flight and fixed-wavelength neutrons without changing the mathematical form. The optimized use of the function and the accuracy of deduced parameters are also discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 286-291 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Daresbury station 8.3 powder diffractometer has been used to determine the lattice parameter of tungsten powder to about 3–6 p.p.m. with respect to the National Institute of Standards and Technology SRM640B silicon de facto standard. The measurement and analysis algorithms that have been developed indicate that there are no X-ray optical systematic errors, that the mean deviation between calculated and measured 2θ ranges from 0.0003 to 0.0005° (corresponding to the absolute precision claimed for the optical angle encoder by the manufacturer) and that the lattice parameter of tungsten powder at 298 K is 3.165269 (19) Å. Two different wavelengths were used, λ ∼1 and λ ∼1¼ Å, but the analysis algorithm is wavelength independent; no measurement of or assumption about the X-ray wavelength is required.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 180-184 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Silver behenate, a possible low-angle diffraction standard, was characterized using the powder diffraction technique. Diffraction patterns obtained with 1.54 Å synchrotron and Cu Kα radiations showed thirteen regularly spaced (00l) peaks in the range 1.5–20.0°2θ. With the National Institute of Standards and Technology's standard reference material silicon as an internal standard, the long spacing of silver behenate was accurately determined from the profile-fitted synchrotron diffraction peaks, with d001 = 58.380 (3) Å. This result was in agreement with that obtained from the Cu Kα pattern. The profile widths of the silver behenate peaks were found to be consistently larger than those of the silicon peaks, indicating significant line broadening for silver behenate. The average crystallite size along the long-spacing direction of silver behenate was estimated using the Scherrer equation, giving Davg = 900 (50) Å. Because silver behenate has a large number of well defined diffraction peaks distributed evenly in the 1.5–20.0°2θ range, it is suitable for use as an angle-calibration standard for low-angle diffraction. However, care must be taken if silver behenate is to be used as a peak-profile calibration standard because of line broadening.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 526-534 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Following the profile decomposition of CeO2 X-ray powder data into individual structure factors, the maximum-entropy method (MEM) has been used to obtain an electron-density-distribution map. In the profile decomposition process, it is impossible to avoid the problems of overlapping peaks which have the same magnitude of reciprocal vectors, such as d*(511) and d*(333), for a cubic crystal, or very severely overlapping reflections. The formalism to treat such overlapping reflections in the MEM analysis is to introduce combined structure factors. The maximum value of the scattering vector, 4π(sinθ)/λ, which was used in the present analysis is small (about 7.8 Å−1) but the resulting electron-density-distribution map is of a high quality and much superior to the conventional map. As a consequence, the ionic charge of Ce and O ions can be obtained with reasonable accuracy from the MEM density map. Furthermore, the map reveals the existence of electrons around the supposedly vacant site surrounded by eight O atoms, which is probably related to the high ionic conductivity of this substance.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 282-285 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A straightforward method for the systematic peak-shift correction using the standard reference material is proposed for the least-squares determination of unit-cell parameters. It requires no pre-determined angle-calibration curve, and the peak-shift correction can be applied simultaneously during the least squares. The procedure, programmed with Fortran 77 statements, has been tested with powder diffractometer data of an α-SiO2 + Si mixture. Advantages of the procedure are: (i) all reflection data from both sample and standard reference material contribute to determining the angle-dependent calibration curve, and (ii) one reflection from the standard reference material suffices for the correction of systematic errors.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 583-590 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The procedure for determining unit-cell parameters from Bragg reflection data, using a standard reference material but without a calibration curve, is described. In this procedure, the observation equations for both the sample to be measured (SMP) and a standard reference material (SRM) are solved simultaneously and the unit-cell parameters and a form of error function are determined during the least-squares calculation. The theory, which was first proposed as a linear least-squares procedure [Toraya & Kitamura (1990). J. Appl. Cryst. 23, 282–285], has been extended to create a nonlinear least-squares procedure. The procedure can be used in two different ways. In one approach, the unit-cell parameters of the SMP and the parameters in the error function are refined while the unit-cell parameters of the SRM are fixed during the least-squares calculation. This procedure requires knowledge of the wavelength but it gives a stable solution and the tangent term in the error function gives a perfect correction for the error in wavelength. In the other approach, the unit-cell parameters of both the SMP and the SRM are refined, together with the parameters in the error function. The procedure does not require knowledge of the wavelength. The solution, however, became unstable when the correlation was strong between the unit-cell parameters and the error function and careful selection of the error function was required. The first approach gave the same result as the second and is, therefore, more practical to use. Since the form of the angle-dependent error function is determined using reflection data from both the SMP and the SRM, just one or two reflections from the SRM were enough for the correction of systematic error. The procedure, coupled with high-precision reflection data, can determine accurately the unit-cell parameters in a routine analysis.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 27 (1994), S. 961-966 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Bragg reflection profiles in asymmetric diffraction using pseudo-parallel-beam geometry were examined and compared with the experimental data. For high collimation and strict monochromatization of the X-ray beam, an Si(111) channel-cut crystal was mounted on the incident-beam side while a receiving slit or a Ge(111) flat-crystal analyzer was used on the diffracted-beam side. Profile intensities for CeO2 powders, observed by symmetric θ–2θ scanning and asymmetric 2θ scanning at various fixed incident angles α (1–45°), were analyzed using individual-profile-fitting techniques. The variations of observed peak width and integrated intensity with α and 2θ were in good agreement with the theory. Practically no peak broadening occurred for α 〉 10° while the peak width increased gradually with decreasing αbelow 10°. With a Ge(111) flat-crystal analyzer, the peak broadening at α 〈 10° was suppressed below 0.05–0.07° in full width at half-maximum.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 774-777 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An intensity enhancement obtained from asymmetric diffraction with a fixed incident angle α has been studied. Parallel-beam synchrotron radiation with λ = 1.54 Å (Stanford Synchrotron Radiation Laboratory) and λ = 1.53 Å (Photon Factory) was used to collect powder diffraction patterns of Si, CeO2 (α = 5 and 10°) and monoclinic ZrO2 (α = 10°). The synchrotron-radiation data were analyzed using single-reflection profile fitting and whole-powder-pattern fitting techniques. The integrated intensities in the asymmetric diffraction were compared with those of symmetric diffraction obtained by the conventional θ–2θ scanning technique. An intensity, after correction for a limited height of counter aperture, was enhanced by factors of 1.8 (α = 5°) and 1.7 (α = 10°) at the maximum in asymmetric diffraction and its magnitudes agreed well with those calculated from theory.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 79-82 (Jan. 1991), p. 245-250 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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