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  • 1
    Electronic Resource
    Electronic Resource
    Determination of the local Al concentration in AlxGa1−xAs-GaAs quantum well structures using the (200) diffraction intensity obtained with a 10 A(ring) electron beam (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 1454-1456 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A novel method for determining the local concentration of Al in the AlxGa1−xAs layer of AlxGa1−xAs-GaAs multiple quantum well structures is reported. By scanning a 10 A(ring) electron beam across the interface, the (200) dark-field scanning transmission electron microscopy (STEM) image shows the contrast of the AlxGa1−xAs-GaAs multilayer since the intensity of the (200) diffraction is sensitive to the Al concentration. The line scan intensity profile of the (200) diffraction, along a uniform specimen region of known thickness, shows the intensity variation of the (200) diffraction and reflects the local content of Al in each region. The simulation of the nanodiffraction patterns produces a chart of the (200) diffraction intensity versus the Al concentration for the determination of the local change of the Al concentration. A molecular beam epitaxy grown AlxGa1−xAs-GaAs specimen (x=0.57 as determined from Raman spectroscopy) is tested and the dark-field STEM studies show two thin layers of x=0.46 at the 1/3 and 2/3 height level within every AlxGa1−xAs layer.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.100695
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  • 2
    Electronic Resource
    Electronic Resource
    Improved instrument for medium energy electron diffraction and microscopy of surfaces (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1215-1219 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The REMEDIE system for reflection electron microscopy and electron diffraction at intermediate energies (0.5–20 keV) has been rebuilt with an improved imaging resolution of better than 10 nm, a convenient and versatile system for observation diffraction patterns and provision for specimen preparation and treatment suitable for surface structural studies. The current capabilities of the instrument are illustrated by results obtained from cleaved and annealed silicon (111) surfaces with or without thin deposited silver and gold layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1137978
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  • 3
    Electronic Resource
    Electronic Resource
    High Resolution Electron Microscopy (1987)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physical Chemistry 38 (1987), S. 57-88 
    Details
    ISSN: 0066-426X
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.pc.38.100187.000421
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  • 4
    Electronic Resource
    Electronic Resource
    High-Resolution Electron Microscopy of Inorganic Materials (1976)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Materials Research 6 (1976), S. 53-81 
    Details
    ISSN: 0084-6600
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.ms.06.080176.000413
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  • 5
    Electronic Resource
    Electronic Resource
    High Resolution Electron Microscopy of Crystal Defects and Surfaces (1978)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Physical Chemistry 29 (1978), S. 251-283 
    Details
    ISSN: 0066-426X
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.pc.29.100178.001343
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  • 6
    Electronic Resource
    Electronic Resource
    Electron-diffraction and electron-microscopy methods for the study of ordering in crystals (1975)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 204-204 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The diffraction of electrons is, in principle, a very sensitive probe of the relative atomic positions in ordered or disordered crystals. The full potential of electron diffraction and electron microscopy methods for the study of local atomic arrangements has not been realised because of the difficulties of conducting experiments under sufficiently well defined conditions and because of the complications introduced by the dynamical diffraction processes involved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889875010175
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  • 7
    Electronic Resource
    Electronic Resource
    The structure of Pt particles on γ-Al2O3 support (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 300-305 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Samples of the catalyst Pt/γ-Al2O3 have been examined by high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy (STEM) and microdiffraction techniques. An epitaxic relationship of metallic Pt crystals on the γ-Al2O3 has been established. In both calcined and reduced samples, the crystalline oxide α-PtO2 was found along with metallic Pt. The oxide has a hexagonal lattice with unit-cell dimensions about 6% smaller than those previously reported. Microdiffraction from areas less than 20 Å in diameter, combined with HRTEM, STEM and secondary electron microscopy (SEM), has proved to be a very powerful technique for the study of the structures of particles less than 50 Å in size.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086631
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  • 8
    Electronic Resource
    Electronic Resource
    Refinement of the defect structure of `GeNb9O25' by high-resolution electron microscopy (1976)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 32 (1976), S. 799-805 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: It has been previously established that calculations of intensity distributions in high-resolution electron-microscope images of crystal structures can reproduce the experimental observations. The use of comparisons Of observed and computed images for structure analysis has been extended for the first time to the refinement of a defect structure in the case of crystals of nominal composition 'GeNb9O25. The results show that previously proposed models for the disordered atom configurations around 'tetrahedral' sites are not completely correct. A new model is proposed which shows good agreement between computed and observed images. This model suggests an interpretation for observations on other related structures in terms of a new type of defect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739476001630
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  • 9
    Electronic Resource
    Electronic Resource
    Diffraction by crystals with planar faults. II. Magnesium fluorogermanate (1976)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 32 (1976), S. 88-91 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Continuous streaks and the displacement of diffraction maxima from the perfect-crystal positions, observed in electron diffraction patterns of magnesium fluorogermanate suggest the existence of planar faults at which the c-axis dimension of the unit cell is contracted by 25%. High-resolution electron microscope images of thin crystals confirm this deduction. It is shown that even in the presence of strong dynamical-diffraction effects, electron diffraction patterns from thin crystals can be interpreted, within well defined limitations, by use of a kinematical theory such as is given in part I [Cowley (1976). Acta Cryst. A32, 83-87]. Using this kinematical theory calculations of diffraction intensity are made for reasonable assumptions of the form of the faults. The effect of the modification of the structure at the fault planes on the peak intensities is shown to be small so that structure analyses based on peak intensities only should give the structure of the unfaulted crystal.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739476000168
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  • 10
    Electronic Resource
    Electronic Resource
    Electron microscopy study of ordering of potassium ions in cubic KSbO3 (1978)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 34 (1978), S. 625-634 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Ordered and disordered states of potassium ions in (111) tunnels in the structure of cubic KSbO3 have been studied by high-resolution electron microscopy. N-beam calculations for the images of both the ordered and disordered states reproduce well the observed images. The disordered state changes into the ordered state under electron irradiation during the observations. Electron diffraction from the specimens and optical diffraction from the images show diffuse spots due to small domains of the long-range-ordered state, but no other diffuse scattering due to short-range order has been observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739478001291
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