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  • 1985-1989  (2)
  • 1975-1979  (1)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 10 (1977), S. 270-276 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The structures of anhydrous calcium silicates Ca3SiO5(C3S), Ca2SiO4 (β-C2S and γ-C2S) and CaSiO3 (CS) have been examined and compared whereas the hydration products of the main cement component C3S have been studied by radial electron density distribution (RED) and infrared (IR) spectroscopy. The polymerization of the initially isolated silica tetrahedra in the course of the hydration process of C3S has been recognized by several authors as the responsible agent of the mechanical resistance developed during the hardening. In this work, the invoked polycondensation has been directly proven by the appearance in the RED curves, between 12 and 48 h, of Si–Si vectors at 3.1 Å and of half-a parameter contributions at 5.65 Å, which represent typical structural features of the poorly crystallized tobermorite-like CSH residue. Independently, this structural transformation was also followed in IR spectra by the shift of the orthosilicate (C3S) Si—O stretching doublet 935–890 cm−1 toward a single higher-frequency band at 975 cm−1. Finally, assuming a linear hydration process, synthetic mixtures of the RED profiles of the three main components, i.e. C3S, tobermorite and CH, account reasonably, within the first 6 Å region, for the sample's RED profiles observed after up to 5 d hydration (63%).
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 471-471 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 478-486 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Yeast cells, Saccharomyces cerevisiae and carlsbergensis, have been analysed by XPS.A preparation and analysis procedure was developed in order to minimize contamination and re-arrangements of the cell surface. The use of an external standard of silica permitted the absolute surface concentrations to be estimated and the influences of sample preparation procedure on surface roughness and chemical composition of the cell surface to be evaluated separately. The selected procedure consisted of washing the cells in distilled water, freezing a pellet in liquid nitrogen, freeze-drying at 268 K, mounting the obtained powder in a trough and pressing the surface.Repeated analyses on a given yeast strain enable the variances linked to the main steps of the preparation procedure for each surface element to be evaluated; thereby, confidence intervals can be given for any small set of XPS data. Freeze-drying is the main source of variation and samples which have to be compared should be freeze-dried together. The reproducibility of the surface concentration decreases in the order C, O, N, P and is much better for the N/P ratio than for N or P alone.The neutrality of the XPS preparation and analysis procedure towards the yeast cell surface is supported by the correlation obtained for ten yeast strains between the surface N/P ratio (dehydrated state) and the electrophoretic mobility at pH 4 (hydrated state). This gives confidence in the ability of XPS to investigate a biological surface. The surface specificity of XPS is illustrated by the very low O/C (0.39) and N/C (0.1) concentration ratios which denote a high proportion of lipids at the cell surface (60-70%), in contrast with the low proportion in the whole cell wall (8%).
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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