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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 45 (1988), S. 355-360 
    ISSN: 1432-0630
    Keywords: 81.10 ; 68.55 ; 42.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Diamond-like carbon thin films were prepared by pulsed-laser evaporation. In this method a carbon target was irradiated by a XeCl laser with a power density of 3×108 W/cm2 and carbon atoms, together with a small number of ions, were produced. Deposition rates and film properties changed sensitively with substrate temperature. The films deposited at 50°C were diamond-like, having reasonable hardness, high refractive index (2.1–2.2 at 633 nm), optical transparency in the infrared, electrical resistivity of 108 Ω cm and chemical inertness (no dissolution in a HF∶HNO3 solution). The band gap measured from optical absorption was 1.4 eV. Raman spectrum and infrared absorption, whose features varied with the substrate temperature, were also measured. The films were amorphous and no crystallinity was observed, as confirmed by x-ray diffraction, transmission electron diffraction and Raman spectroscopy. Hydrogen atoms were incorporated in the films with a typical H/C ratio of 0.3. The application of a negative bias to the substrate modified the deposition due to the presence of ions.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part A: Polymer Chemistry 26 (1988), S. 2839-2847 
    ISSN: 0887-624X
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In Auger electron spectroscopy, the relative sensitivities of elements, which are widely used in quantitative analysis, are primarily obtained by measurement. Nevertheless, it is very tedious to collect all relative elemental sensitivity factors for different primary electron beam energies. In view of this, we have examined methods of deriving the relative sensitivity factor for an arbitrary electron beam energy from one experimental value determined at a set energy. For this calculation, we have to consider the contributions of the ionization cross-section and the electron backscattering factor. Several formulas for the ionization cross-section and the backscattering correction factor have been reported. We have performed experiments to examine their correction accuracy. It was found that when Gryziński's formula is used as the ionization cross-section and Love-Scott's formula as the backscattering correction factor, the difference between calculated sensitivity values and measured values was found to be 〈15% for excitation energies of 〈20 keV.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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