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Digitale Medien

Measurement of the thermal conductivity of molten semiconductors (1988)

Nakamura, S. ; Hibiya, T. ; Yamamoto, F.

Springer

International journal of thermophysics 9 (1988), S. 933-940

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Details

ISSN: 1572-9567

Schlagwort(e): alumina ; high temperature ; InSb ; thermal conductivity ; transient hot-wire method

Quelle: Springer Online Journal Archives 1860-2000

Thema: Physik

Notizen: Abstract The thermal conductivity of molten InSb in the temperature range between 800 and 870 K was measured by the transient hot-wire method using a ceramic probe. The probe was fabricated from a tungsten wire printed on an alumina substrate and coated with a thin alumina layer. The thermal conductivity was found to be about 18 W· m−·K−at the melting point and increased moderately with increasing temperature. The thermal conductivity of alumina used as the substrate for the probe was also measured in the same temperature range.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF01133261

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