Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1985-1989  (3)
Source
Material
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Performance of an automated rotating-detector ellipsometer (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3625-3632 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A computer-controlled rotating-detector ellipsometer (RODE) has been constructed using a windowless planar-diffused Si photodiode, a stepping motor, an operational amplifier, and a personal computer (PC) equipped with an A/D-D/A converter. The detector is mounted to the output shaft of the stepping motor at an optimum angle of incidence of ∼59° and is rotated through 360° about the incident beam as an axis. The detector output signal voltage is measured and stored in the PC at every 2° increment of the RODE angle θ. Fourier analysis of the recorded data provides a handedness-blind determination of the state of polarization of the incident light. A beam from a HeNe laser (λ=632.8 nm) is transmitted through the polarizing optics of an ellipsometer to provide the polarization states needed for calibration and testing. The calibration parameters mL and θr are determined by rotating the detector about a linearly polarized beam of light of zero reference azimuth. The RODE is subsequently tested and found to correctly measure the first two normalized Stokes parameters of a number of states with a residual rms error of ∼0.002. This limit on precision is dictated mainly by the 12-bit A/D converter. A small angular misalignment of the rotation axis of the detector with respect to the light-beam axis introduces odd harmonics in the detector signal; hence, its effect is readily isolated by appropriate data reduction. Thin-film coatings on the detector surface that significantly improve the performance of the RODE are proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140517
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Construction, calibration, and testing of a four-detector photopolarimeter (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 84-88 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A computer-controlled four-detector photopolarimeter (FDP) has been constructed using four windowless planar-diffused Si photodiodes, operational amplifiers, an analog-to-digital (A/D) converter, and a personal computer with peripherals. A nonplanar light path is selected with incidence angles at the first three detectors of ∼65° and with rotations of ∼45° between the successive planes of incidence. The last detector, which is coated for minimum reflectance, intercepts the beam at a small angle and the residual light it reflects is dumped. A 1-mW He–Ne laser beam (λ=632.8 nm) passes through the polarizing optics of an ellipsometer to provide the polarization states needed for calibration and testing. With an optimum set of calibration states, the instrument matrix A is determined. The FDP is subsequently tested and found to correctly measure the normalized Stokes parameters of a large number of states with an average absolute error of ∼0.01, which is attributed to imperfections in the calibration optics. This first prototype instrument has a precision of ∼0.2%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139971
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Two-detector ellipsometer (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1746-1748 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An ellipsometer with two photodetectors and no other optical elements is described. In general, each detector has a partially specularly obliquely reflecting surface and generates an electrical signal proportional to the fraction of radiation it absorbs. It is not essential (but desirable) that the two detectors absorb all of the incident radiation. The output signals of the two detectors, with parallel or nonparallel surfaces, are enough to determine the degree of linear polarization P of incident light with respect to one set of transverse orthogonal axes. If the assembly of two parallel detectors is rotated around the light beam by an angle (of 45°), a new degree of linear polarization P' is measured. From P and P' the (generally elliptic) polarization state of incident totally polarized light can be completely determined, except for handedness. A calibration procedure for this two-detector ellipsometer (TDE) is given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138087
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...